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  • Secondary Ion Mass Spectrometry Sims IV: Proceedings of the Fourth International Conference, Osaka, Japan, November 13-19, 1983

    Secondary Ion Mass Spectrometry Sims IV: Proceedings of the Fourth International Conference, Osaka, Japan, November 13-19, 1983

    This volume contains the proceedings of the Tenth International Converence on Secondary Ion Mass Spectrometry (SIMS X). It covers a diverse field of research ranging from environmental problems to depth profiling and semiconductors. In doing so, it... more

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    Secondary Ion Mass Spectrometry SIMS IV

    Secondary Ion Mass Spectrometry SIMS IV

    This volume contains full proceedings of the Fourth International Conference on Secondary Ion Mass Spectrometry (SIMS-IV), held in the Minoo-Kanko Hotel, Osaka, Japan, from November 13th to 19th, 1983. Coordinated by a local or� ganizing committee... more

    $99.00

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